Characterization of electromagnetic properties of mid materials for high frequency applications up to 67 GHz

authored by: Quang Huy Dao, Aline Friedrich, Bernd Geck
Abstract: This paper presents results of the research project: "Characterization of the radio frequency (RF) properties of LDS-MID" where RF parameters of laser direct structureable (LDS) molded interconnect device (MID) materials were investigated. First of all the most important material parameters influencing the RF performance of a device are introduced. In the next section the broadband characterization of the metallization and material properties using a coplanar waveguide (CPW) is described. For a selected LDS material the conduction losses due to different metallization compositions are discussed in detail.
Organisation(s): Institute of Microwave and Wireless Systems
Type: Conference contribution
Pages: 63-68
No. of pages: 6
Publication date: 09.2014
Publication status: Published
Peer reviewed: Yes
ASJC Scopus subject areas: General Engineering
Electronic version(s): https://doi.org/10.4028/www.scientific.net/AMR.1038.63 (Access: Closed)
: Details in the research portal "Research@Leibniz University"