Characterization of electromagnetic properties of mid materials for high frequency applications up to 67 GHz
- verfasst von
- Quang Huy Dao, Aline Friedrich, Bernd Geck
- Abstract
This paper presents results of the research project: "Characterization of the radio frequency (RF) properties of LDS-MID" where RF parameters of laser direct structureable (LDS) molded interconnect device (MID) materials were investigated. First of all the most important material parameters influencing the RF performance of a device are introduced. In the next section the broadband characterization of the metallization and material properties using a coplanar waveguide (CPW) is described. For a selected LDS material the conduction losses due to different metallization compositions are discussed in detail.
- Organisationseinheit(en)
-
Institut für Hochfrequenztechnik und Funksysteme
- Typ
- Aufsatz in Konferenzband
- Seiten
- 63-68
- Anzahl der Seiten
- 6
- Publikationsdatum
- 09.2014
- Publikationsstatus
- Veröffentlicht
- Peer-reviewed
- Ja
- ASJC Scopus Sachgebiete
- Allgemeiner Maschinenbau
- Elektronische Version(en)
-
https://doi.org/10.4028/www.scientific.net/AMR.1038.63 (Zugang:
Geschlossen)
