Contactless scattering parameter measurements

authored by: Thomas Zelder, Bernd Geck
Abstract: An introduction to contactless vector network analysis is given for the determination of the scattering parameters of embedded devices. In the measurement setup, contactless probes are connected to a conventional vector network analyzer. Suitable probes are developed for the implementation of a contactless measurement setup, whereas the positioning of the probes is essential for an accurate measurement setup. The contactlessly measured results are compared to results received with a conventional vector network analyzer. These comparisons show that it is possible to characterize embedded devices with the contactless vector network analysis at least up to 6 GHz using the suggested probes.
Organisation(s): Institute of Microwave and Wireless Systems
External Organisation(s): Panasonic Industrial Devices Europe GmbH
Type: Article
Journal: IEEE Microwave and Wireless Components Letters
Volume: 21
Pages: 504-506
No. of pages: 3
ISSN: 1531-1309
Publication date: 09.2011
Publication status: Published
Peer reviewed: Yes
ASJC Scopus subject areas: Condensed Matter Physics, Electrical and Electronic Engineering
Electronic version(s): https://doi.org/10.1109/LMWC.2011.2162619 (Access: Closed)
: Details in the research portal "Research@Leibniz University"

BibTeX

@article{6b4cb2c388584462b501c9f52f82d801,
title = "Contactless scattering parameter measurements",
abstract = "An introduction to contactless vector network analysis is given for the determination of the scattering parameters of embedded devices. In the measurement setup, contactless probes are connected to a conventional vector network analyzer. Suitable probes are developed for the implementation of a contactless measurement setup, whereas the positioning of the probes is essential for an accurate measurement setup. The contactlessly measured results are compared to results received with a conventional vector network analyzer. These comparisons show that it is possible to characterize embedded devices with the contactless vector network analysis at least up to 6 GHz using the suggested probes.",
keywords = "Calibration technique, contactless scattering-parameter measurement, electromagnetic probe, microwave circuit testing, vector network analyzer (VNA)",
author = "Thomas Zelder and Bernd Geck",
note = "Funding Information: Manuscript received February 24, 2011; revised June 08, 2011; accepted June 22, 2011. Date of publication August 12, 2011; date of current version September 02, 2011. This work was supported by Rosenberger Hochfrequen-ztechnik GmbH & Co. KG and also by Rohde & Schwarz GmbH & Co. KG and SUSS MicroTec. T. Zelder is with Panasonic Electronic Devices Europe GmbH, L{\"u}neburg 21337, Germany (e-mail: thomas.zelder@eu.panasonic.com). B. Geck is with the Institute of Radiofrequency and Microwave Engineering, Leibniz Universit{\"a}t Hannover, Hannover 30167, Germany. Color versions of one or more of the figures in this letter are available online at http://ieeexplore.ieee.org. Digital Object Identifier 10.1109/LMWC.2011.2162619",
year = "2011",
month = sep,
doi = "10.1109/LMWC.2011.2162619",
language = "English",
volume = "21",
pages = "504--506",
journal = "IEEE Microwave and Wireless Components Letters",
issn = "1531-1309",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "9",
}