Contactless scattering parameter measurements
- verfasst von
- Thomas Zelder, Bernd Geck
- Abstract
An introduction to contactless vector network analysis is given for the determination of the scattering parameters of embedded devices. In the measurement setup, contactless probes are connected to a conventional vector network analyzer. Suitable probes are developed for the implementation of a contactless measurement setup, whereas the positioning of the probes is essential for an accurate measurement setup. The contactlessly measured results are compared to results received with a conventional vector network analyzer. These comparisons show that it is possible to characterize embedded devices with the contactless vector network analysis at least up to 6 GHz using the suggested probes.
- Organisationseinheit(en)
-
Institut für Hochfrequenztechnik und Funksysteme
- Externe Organisation(en)
-
Panasonic Industrial Devices Europe GmbH
- Typ
- Artikel
- Journal
- IEEE Microwave and Wireless Components Letters
- Band
- 21
- Seiten
- 504-506
- Anzahl der Seiten
- 3
- ISSN
- 1531-1309
- Publikationsdatum
- 09.2011
- Publikationsstatus
- Veröffentlicht
- Peer-reviewed
- Ja
- ASJC Scopus Sachgebiete
- Physik der kondensierten Materie, Elektrotechnik und Elektronik
- Elektronische Version(en)
-
https://doi.org/10.1109/LMWC.2011.2162619 (Zugang:
Geschlossen)
