Contactless network analysis system for the calibrated measurement of the scattering parameters of planar two-port devices

authored by: Thomas Zelder, Bernd Geck, Michael Wollitzer, Ilona Rolfes, Hermann Eul
Abstract: In this paper a system for the contactless measurement of the scattering parameters of planar two-port devices is presented. Thereby, loop couplers are used as probes. The system is calibrated with the Thru-Reflect-Line calibration algorithm regarding planar reference planes. This provides the possibility to measure scattering parameters of devices embedded in complex planar circuits. The contactless measured scattering parameters of different devices are compared with results received by a conventional vector network analyzer. This comparison shows that the results are corresponding to each other. Furthermore, it is shown, that a contactless measurement of an embedded DUT is possible.
Organisation(s): Institute of Microwave and Wireless Systems
External Organisation(s): Rosenberger Hochfrequenztechnik GmbH and Co. KG
Type: Conference contribution
Pages: 246-249
No. of pages: 4
Publication date: 2007
Publication status: Published
Peer reviewed: Yes
ASJC Scopus subject areas: Electrical and Electronic Engineering
Electronic version(s): https://doi.org/10.1109/EUMC.2007.4405172 (Access: Closed)
: Details in the research portal "Research@Leibniz University"

BibTeX

@inproceedings{cefa13852f174123a15ca5bb178616a0,
title = "Contactless network analysis system for the calibrated measurement of the scattering parameters of planar two-port devices",
abstract = "In this paper a system for the contactless measurement of the scattering parameters of planar two-port devices is presented. Thereby, loop couplers are used as probes. The system is calibrated with the Thru-Reflect-Line calibration algorithm regarding planar reference planes. This provides the possibility to measure scattering parameters of devices embedded in complex planar circuits. The contactless measured scattering parameters of different devices are compared with results received by a conventional vector network analyzer. This comparison shows that the results are corresponding to each other. Furthermore, it is shown, that a contactless measurement of an embedded DUT is possible.",
keywords = "Calibration technique, Contactless scattering-parameter measurement, Electromagnetic probe, Microwave circuit testing, Vector network analyzer",
author = "Thomas Zelder and Bernd Geck and Michael Wollitzer and Ilona Rolfes and Hermann Eul",
year = "2007",
doi = "10.1109/EUMC.2007.4405172",
language = "English",
isbn = "9782874870033",
series = "Proceedings of the 37th European Microwave Conference, EUMC",
pages = "246--249",
booktitle = "Proceedings of the 37th European Microwave Conference, EUMC",
note = "37th European Microwave Conference, EUMC ; Conference date: 09-10-2007 Through 12-10-2007",
}