Contactless vector network analysis with printed loop couplers

authored by: Thomas Zelder, Bernd Geck, Michael Wollitzer, Ilona Rolfes, Hermann Eul
Abstract: In this paper, an introduction to contactless vector network analysis is given. Furthermore, the implementation of a contactless measurement setup is presented using different printed coupling structures. The coupling structures are connected to a vector network analyzer (VNA) by means of conventional on-wafer probes, as well as planar-coaxial transitions. For the contactless method, conventional calibration algorithms are used to determine the scattering parameters of a device within a complex planar circuit. The contactless measured results are compared to results received with a conventional VNA and to simulation results obtained with a 3-D field simulator. These comparisons show that, especially for small coupling structures of approximately 1 mm, the results correspond well up to 20 GHz.
Organisation(s): Institute of Microwave and Wireless Systems
External Organisation(s): Rosenberger Hochfrequenztechnik GmbH and Co. KG
Type: Article
Journal: IEEE Transactions on Microwave Theory and Techniques
Volume: 56
Pages: 2628-2634
No. of pages: 7
ISSN: 0018-9480
Publication date: 11.2008
Publication status: Published
Peer reviewed: Yes
ASJC Scopus subject areas: Radiation, Condensed Matter Physics, Electrical and Electronic Engineering
Electronic version(s): https://doi.org/10.1109/TMTT.2008.2005893 (Access: Closed)
: Details in the research portal "Research@Leibniz University"

BibTeX

@article{cb5f6df94a8e41e89a107d0285240759,
title = "Contactless vector network analysis with printed loop couplers",
abstract = "In this paper, an introduction to contactless vector network analysis is given. Furthermore, the implementation of a contactless measurement setup is presented using different printed coupling structures. The coupling structures are connected to a vector network analyzer (VNA) by means of conventional on-wafer probes, as well as planar-coaxial transitions. For the contactless method, conventional calibration algorithms are used to determine the scattering parameters of a device within a complex planar circuit. The contactless measured results are compared to results received with a conventional VNA and to simulation results obtained with a 3-D field simulator. These comparisons show that, especially for small coupling structures of approximately 1 mm, the results correspond well up to 20 GHz.",
keywords = "Calibration technique, Contactless scattering-parameter measurement, Electromagnetic probe, Microwave circuit testing, Vector network analyzer (VNA)",
author = "Thomas Zelder and Bernd Geck and Michael Wollitzer and Ilona Rolfes and Hermann Eul",
year = "2008",
month = nov,
doi = "10.1109/TMTT.2008.2005893",
language = "English",
volume = "56",
pages = "2628--2634",
journal = "IEEE Transactions on Microwave Theory and Techniques",
issn = "0018-9480",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "11",
}