Contactless vector network analysis

A new approach for S-parameter measurements

authored by: Thomas Zelder, Bernhard Rosenberger, Bernd Geck, Ilona Rolfes
Abstract: After a short introduction to conventional vector network analysis the principle and the implementation of a contactless measurement setup for the determination of the scattering parameters of embedded devices is presented. Suitable contactless and pseudo-contactless probes are developed for the implementation of the setup and calibration procedures which take the characteristic of the probes into account are described. For verification purposes the contactlessly measured results are compared with results received with a conventional vector network analyzer as well as with simulation results obtained with a 3D field simulator.
Organisation(s): Institute of Microwave and Wireless Systems
External Organisation(s): Rosenberger Hochfrequenztechnik GmbH and Co. KG
Type: Conference contribution
Pages: 1266-1289
No. of pages: 24
Publication date: 2009
Publication status: Published
Peer reviewed: Yes
ASJC Scopus subject areas: Computer Networks and Communications, Electrical and Electronic Engineering
: Details in the research portal "Research@Leibniz University"